The 8th International Conference on Spectroscopic Ellipsometry continues the well-established ICSE series to provide an excellent forum for scientists and engineers working in instrumentation, science and applications of spectroscopic ellipsometry and related techniques. ICSE-8 will bring together international participants from many countries and offer them the opportunity to present their latest results. Both young and experienced researchers are kindly invited to participate and interact for dissemination, discussion, and advancement of science and technology topics represented in ICSE-8. ICSE-8 will aim at presenting a useful balance of fundamental and applied research and industrial applications.
Submission of original work is solicited on the topics suggested below and in related subject matters.
Anisotropic Materials
Electronic Materials
Ellipsometry in Bio-Related Systems
Energy Applications
Hybrid and Ferroelectric Materials
Imaging and Process Monitoring
Mueller-Matrix Ellipsometry
Nanostructured and Metamaterials
New Instrumental Developments
Optical and Electronic Applications
Optical Modeling
Organic and Polymer Materials
Polarimetry and Scatterometry
Solid–Liquid Interfaces
THz Applications
Two-Dimensional Systems
Confirmed invited speakers:
David E. Aspnes, Rasheed M. A. Azzam, Eva Bittrich, Alain C. Diebold, Hiroyuki Fujiwara, Karsten Hinrichs, Gerald E. Jellison, Oriol Arteaga, Gang Jin, Razvigor Ossikovski, Peter Petrik, Xiuguo Chen, Vanya Darakchieva, Zhigao Hu, Daesuk Kim, Sean Knight, Alexey Kuzmenko, Premysl Marsik , Arturo Mendoza Galván, Alyssa Mock, Tatiana Novikova, Steffen Richter
Organizing Committee
M. Isabel Alonso (Chair)
Oriol Arteaga (Vice-Chair)
Miquel Garriga (Program Chair)
Stefan Zollner (Proceedings Chair)
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